
Dry Etching Systems Designed for SiC Power Device Manufacturing
Deposition of SiOC:H Films Suitable for MEMS Manufacturing
The Bosch Process Data
Low-scallop Etching Process and Sidewall Smoothing Process
Empirical evidence for a two phase system in SiCN films prepared by low pressure PE-CVD
Plasma Dicing and Scribing Technology for GaAs Based Devices
High-Speed, Deep Silicon Etching for R&D
Chlorine-Based ICP Etching for Improving the Luminance Efficiency in Nitride LEDs
SiO2 and SiN etching by Low Global Warming Potential Gas
Breakthrough for the Next Generation Power Devices
High-speed Etching of SiO2 and SiC
Plasma Cleaning of LED Lighting Package
Deep Etching of Compound Semiconductors
SiC Power Device Projects at SAMCO
Square Hole Etching of Silicon
GaN MOSFET with SiO2 Gate Oxide Deposited by Silane-Based PECVD
Properties of SiCN films prepared by Cathode Coupled P-CVD Using Liquid Source Material
Deposition of SiOC:H Films Suitable for MEMS Manufacturing
Empirical evidence for a two phase system in SiCN films prepared by low pressure PE-CVD
Breakthrough for the Next Generation Power Devices
GaN MOSFET with SiO2 Gate Oxide Deposited by Silane-Based PECVD
Properties of SiCN films prepared by Cathode Coupled P-CVD Using Liquid Source Material
Dry Etching Systems Designed for SiC Power Device Manufacturing
Precise Thickness Control in Recess Etching of AlGaN/GaN-HFET Manufacturing
The Bosch Process Data
Low-scallop Etching Process and Sidewall Smoothing Process
Plasma Dicing and Scribing Technology for GaAs Based Devices
High-Speed, Deep Silicon Etching for R&D
Chlorine-Based ICP Etching for Improving the Luminance Efficiency in Nitride LEDs
SiO2 and SiN etching by Low Global Warming Potential Gas
Breakthrough for the Next Generation Power Devices
High-speed Etching of SiO2 and SiC
Deep Etching of Compound Semiconductors